Hybrid IR characterization wafer 200mm/300mm

Hybrid IR characterization wafer 200mm/300mm

  • -45C to +175C – camera determines accuracy
  • for use with air and/or watercooled cameras
  • 1-4 integrated, calibrated reference sensors for normalization of temperature data
  • comprehensive surface map for detailed temperature gradients, each pixel a datapoint
  • resolution <0.1C camera dependent
  • accuracy to <0.05K over whole range
  • No high temperature flicker

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